The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.
This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Contents
CHP 1 - General Introduction to Transmission
Electron Microscopy (TEM)
Peter Goodhew
CHP 2 - Introduction to Electron Optics
Gordon Tatlock
CHP 3 - Development of STEM
L. M. Brown
CHP 4 - Lens Aberrations: Diagnosis and Correction
Andrew Bleloch Quentin Ramasse
CHP 5 - Theory and Simulations of STEM Imaging
Peter D. Nellist
CHP 6 - Details of STEM
Alan Craven
CHP 7 - Electron Energy Loss Spectrometry and Energy
Dispersive X‐ray Analysis
Rik Brydson Nicole Hondow
CHP 8 - Applications of Aberration‐Corrected
Scanning Transmission Electron Microscopy
Mervyn D. Shannon
CHP 9 - Aberration‐Corrected Imaging in CTEM
Sarah J. Haigh Angus I. Kirkland
Appendix A: Aberration Notation
Appendix B: General Notation
Index
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