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Ebook - Advanced Characterization Techniques for Thin Film Solar Cells


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About This Book

The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.
Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.



Contents



Volume 1

Part 1 I : Introduction

CHP 1    -   Introduction to Thin‐Film Photovoltaics
Thomas Kirchartz Daniel Abou‐Ras Uwe Rau

Part 1 II : Device Characterization

CHP 2    -   Fundamental Electrical Characterization of Thin‐Film Solar Cells
Thomas Kirchartz Kaining Ding Uwe Rau

CHP 3    -   Electroluminescence Analysis of Solar Cells and Solar Modules
Thomas Kirchartz Vito Huhn Andreas Gerber Bart E. Pieters Uwe Rau

CHP 4    -   Capacitance Spectroscopy of Thin‐Film Solar Cells
Jennifer Heath Pawel Zabierowski

CHP 5    -   Time‐of‐Flight Analysis
Torsten Bronger

CHP 6    -   Transient Optoelectronic Characterization of Thin‐FilmSolar Cells
Carsten Deibel Thomas Kirchartz

CHP 7    -   Steady‐State Photocarrier Grating Method
Rudolf Brüggemann


Part 1 III : Materials Characterization

CHP 8    -   Absorption and Photocurrent Spectroscopy with High Dynamic Range
Thomas Christian Mathias Müller Thomas Kirchartz

CHP 9    -   Spectroscopic Ellipsometry
Jian Li Robert W. Collins Michelle N. Sestak Prakash Koirala Nikolas J. Podraza Sylvain Marsillac Angus A. Rockett

CHP 10  -   Characterizing the Light‐Trapping Properties of Textured Surfaces with Scanning Near‐Field Optical Microscopy
Karsten Bittkau Stephan Lehnen Ulrich W. Paetzold

CHP 11  -   Photoluminescence Analysis of Thin‐Film Solar Cells
Thomas Unold Levent Gütay

CHP 12  -   Electron‐Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a‐Si:H)
Klaus Lips Matthias Fehr Jan Behrends

CHP 13  -   Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells
Sascha Sadewasser Iris Visoly‐Fisher

CHP 14  -   Electron Microscopy on Thin Films for Solar Cells
Daniel Abou‐Ras Melanie Nichterwitz Manuel J. Romero Sebastian S. Schmidt

CHP 15  -   X‐ray and Neutron Diffraction on Materials for Thin‐Film Solar Cells
Susan Schorr Christiane Stephan Tobias Törndahl Rene Gunder Daniel M. Többens


Volume 2

Part 2 III : Materials Characterization

CHP 16  -   In Situ Real‐Time Characterization of Thin‐Film Growth
Paul Pistor Roland Mainz Marc Daniel Heinemann Thomas Unold Roland Scheer

CHP 17  -   Raman Spectroscopy on Thin Films for Solar Cells
Jacobo Álvarez‐García Víctor Izquierdo‐Roca Paul Pistor Thomas Schmid Alejandro Pérez‐Rodríguez

CHP 18  -   Soft X‐ray and Electron Spectroscopy: A Unique “Tool Chest” to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces
Marcus Bär Lothar Weinhardt Clemens Heske

CHP 19  -   Accessing Elemental Distributions in Thin Films for Solar Cells
Volker Hoffmann Denis Klemm Varvara Brackmann Cornel Venzago Angus A. Rockett
Thomas Wirth Tim Nunney Christian A. Kaufmann Raquel Caballero Oana Cojocaru‐Mirédin

CHP 20  -   Hydrogen Effusion Experiments
Wolfhard Beyer Florian Einsele


Part 2 IV : Materials and Device Modeling

CHP 21  -   Ab Initio Modeling of Defects in Semiconductors
Karsten Albe Péter Ágoston Johan Pohl

CHP 22  -   Molecular Dynamics Analysis of Nanostructures
Xiaowang Zhou Jose Chavez David Zubia

CHP 23  -   One‐Dimensional Electro‐Optical Simulations of Thin‐Film Solar Cells
Bart E. Pieters Koen Decock Marc Burgelman Rolf Stangl Thomas Kirchartz

CHP 24  -   Two‐ and Three‐Dimensional Electronic Modeling of Thin‐Film Solar Cells
Ana Kanevce Wyatt K. Metzger

Index

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